%! TEX root = ../thesis.tex

\chapter{Outlook}

    All in all the set goals were achieved.

    While all of the measurements could be calibrated they can still be fine tuned.
    As shown in \autoref{fig:postcalib10v}, the error of a calibrated measurement is not quite minimal.
    In the future it would be possible to make these even more accurate, either by using a different method for calculating, which is not based on second degree polynomials.
    Or by further calibration, as mentioned in the results chapter.

    The voltage distribution, as described in figures~\ref{fig:vdiphist} and~\ref{fig:wrdist}, was quantified and the SWRM could be used for creating a worst-case V\(_\text{drop}\) distribution as seen in \autoref{fig:reg}.
    Therefore a first iteration of a usable regulation mechanism could be implemented and verified (see \autoref{fig:postreg}).
    This mechanism allows for a certain degree of regulation until a current threshold is reachd.
    This threshold was also agreeing with a beforehand calculated value of around \SI{80}{\ampere}

    For further developing this the more complex DWRM could be used.
    This would allow for a more accurate regulation, that would narrow down the worst-case scenario of \autoref{fig:reg}.
    For that model to work, each experiment run on a wafer, in the system, would require a simulation of the distribution of voltage between the used reticles.
    As to minimize the maximum difference in voltage drop.
    This could also factor in the number of active HICANNs per reticle.

    Additionally the current threshold is restricted by the internaly used resistor chain (described in \autoref{fig:gen18v}).
    If the minimum resistance of that circuit were to be changed, the threshold would move up in current.