26 lines
1.8 KiB
TeX
26 lines
1.8 KiB
TeX
%! TEX root = ../thesis.tex
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\chapter{Outlook}
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All in all the set goals were achieved.
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While all of the measurements could be calibrated they can still be fine tuned.
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As shown in \autoref{fig:postcalib10v}, the error of a calibrated measurement is not quite minimal.
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In the future it would be possible to make these even more accurate, either by using a different method for calculating, which is not based on second degree polynomials.
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Or by further calibration, as mentioned in the results chapter.
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The voltage distribution, as described in figures~\ref{fig:vdiphist} and~\ref{fig:wrdist}, was quantified and the SWRM could be used for creating a worst-case V\(_\text{drop}\) distribution as seen in \autoref{fig:reg}.
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Therefore a first iteration of a usable regulation mechanism could be implemented and verified (see \autoref{fig:postreg}).
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This mechanism allows for a certain degree of regulation until a current threshold is reached.
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This threshold was also agreeing with a beforehand calculated value of around \SI{80}{\ampere}
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For further developing this the more complex DWRM could be used.
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This would allow for a more accurate regulation, that would narrow down the worst-case scenario of \autoref{fig:reg}.
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For that model to work, each experiment run on a wafer, in the system, would require a simulation of the distribution of voltage between the used reticles.
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As to minimize the maximum difference in voltage drop.
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This could also factor in the number of active HICANNs per reticle.
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Additionally the current threshold is restricted by the internally used resistor chain (described in \autoref{fig:gen18v}).
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If the minimum resistance of that circuit were to be changed, the threshold would move up in current.
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